The VTI National Transport Library Catalogue

Reliability characteristics of various microcircuit technologies Klein, MR ; Lauffenburger, HA

By: Klein, MRContributor(s): Lauffenburger, HAPublication details: Warrendale, PA Society of Automotive Engineers. Paper nr 77 02 27, 1977Description: 9 sSubject(s): Micro | Circuit (electr) | Reliability (stat) | Failure | Data bank | VTI P2000Location:
Item type: Reports, conferences, monographs
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Statens väg- och transportforskningsinstitut

VTI:s bibliotek i Linköping


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