Reliability characteristics of various microcircuit technologies Klein, MR ; Lauffenburger, HA
Publication details: Warrendale, PA Society of Automotive Engineers. Paper nr 77 02 27, 1977Description: 9 sSubject(s): Bibl.nr: VTI P2000Location:| Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|
| Statens väg- och transportforskningsinstitut | Available |