Reliability characteristics of various microcircuit technologies Klein, MR ; Lauffenburger, HA
Publication details: Warrendale, PA Society of Automotive Engineers. Paper nr 77 02 27, 1977Description: 9 sSubject(s): Micro | Circuit (electr) | Reliability (stat) | Failure | Data bank | PaBibl.nr: VTI P2000Location:| Current library | Call number | Status | Date due | Barcode |
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Statens väg- och transportforskningsinstitut
VTI:s bibliotek i Linköping |
Available |