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Development and test of a dynamic disengagement device Chung, Wen-Yeuan ; Waldron, KJ ; Ishii, K

By: Contributor(s): Publication details: Warrendale, PA Society of Automotive Engineers, 1993; SAE technical paper 93 02 12, Description: 4 sSubject(s): Bibl.nr: VTI P2000Location:
Item type: Reports, conferences, monographs